AFM/STM G: Conductive Tip Atomic Force Microscope

Lab Tour Home

S-20 Osmond Lab
Penn State University

Contacts:
Paul S. Weiss: stm@psu.edu
Jason Monnell: jdm281@psu.edu
Jennifer Hampton jrh@stm1.chem.psu.edu
 

Here are Jenny and Jason posing for a mug shot with our equiment.

We use an Autoprobe CP Research AFM system from Thermomicroscopes/Veeco, where with the standard configuration can acquire 8 data channels simultaneously, from both user inputs (other instrumentation such as lock-in amplifiers, function generators, etc.) and internal data (topography, tip deflection, force, etc.). Using the ability to record multiple data channels at the same time, we are able to use advanced techniques such as potential corrected magnetic force microscopy (PCMFM) and scanning surface potential microscopy (SSPM) to interrogate ferromagnetic and ferroelectric materials. These techniques require a nulling feedback voltage, for which we have designed and built instrumentation.

The picture below shows the instrumentation installed.

The Weiss Group Autoprobe CP Research AFM

Instrumentation visible are: the on-axis color optical CCD camera with zoom lens for feature location and tip alignment, the blue AFM head itself with protective noise cap on, the homebuilt voltage feedback unit, SRS-830 lock-in amplifier, Sony Color monitor for output of the CCD camera, and the SRS-345 function generator. Missing for the photograph are the controller, and user computer.

Previous    |    Next        Lab Tour Home